Precision Reference Specimens

 
 

Precision reference specimens have surfaces that have been carefully worked so as to produce profiles that can be used to calibrate or check various aspects of a surface measuring instrument.

They are most often used with stylus-type contacting surface measuring instruments as standardised in ISO 3274, but are increasingly being used for checking optical and non-contacting instruments, especially with regard to roughness parameter evaluation.

At present, reference specimens for stylus instruments are standardised in ISO 5436 Part 1:2000, where they are referred to as material measures. In that document, specimens of type A are step-height standards, type B are for checking stylus size, types C and D are respectively regular- and random-profile specimens for checking instrument performance and parameter evaluation. The new family of documents numbered ISO 25178 et al at present being developed by ISO is planned to contain a part that describes material measures for 2D as well as 3D surface measurements, which will therefore replace ISO 5436.

All our precision reference specimens are made from electroformed nickel, available from us in 2 versions: with a hard protective top layer of nickel-boron (write E after the item no.), or without this top layer (write X after the item no.) For example, item 542E is specimen 542 with a hard top layer. Please note that the protective layer is sometimes liable to slight discoloration or darkening, as compared with the bare nickel. This discoloration may take the form of faint dark patches or lines over the surface, but these are purely cosmetic and do not in any way alter the quoted roughness parameter values of the specimen.

 
 

Item Number

ISO Type

Parameter Values

Roughness Values

Shape

Profile

501

D

n/a

Ra = 0.02 µm
     = 0.8 µ in

8 x 0.4 mm
random

502

D

n/a

Ra = 0.03 µm
     = 1.2 µ in

4 x 1.25 mm
random

503

D

n/a

Ra = 0.1 µm
     = 4 µ in

4 x 1.25 mm
random

504

D

n/a

Ra = 0.15 µm
     = 6 µ in

4 x 1.25 mm
random

511

A

d = 1 µm
w =  100 µm

n/a

single groove

513

A

d = 1000, 500, 200 and 30 µm
w = 3, 2, 2 and 0.5 mm

n/a

four grooves

514

(not yet available)

A

d = 200 nm and 500 nm

n/a

two grooves

521

B

Sm = 15 µm
Pt = 1.6 µm

Ra = 0.4 µm
     = 15 µ in

sawtooth wave

525

C

Sm = 135 µm
Pt = 19 µm

Ra = 6.25 µm
     = 250 µ in

sine wave

526

C

Sm = 100 µm
Pt = 10 µm

Ra = 3.15 µm
     = 124 µ in

sine wave

527

C

Sm = 100 µm
Pt = 10 µm

Ra = 3.0 µm
     = 120 µ in

sine wave

528

C

Sm = 50 µm
Pt = 1.5 µm

Ra = 0.5 µm
     = 20 µ in

sine wave

529

C

Sm = 10 µm
Pt = 0.3 µm

Ra = 0.1 µm
     = 4 µ in

sine wave

530

C

Sm = 100 µm
Pt = 3.0 µm

Ra = 1 µm
     = 40 µ in

sine wave

531

C

Sm = 100 µm
Pt = 1.0 µm

Ra = 0.3 µm
     = 14 µ in

sine wave

541

(not yet available)

C

Sm = 25 µm
Pt = 1.15 µm

Ra = 0.36 µm
     = 14.2 µ in

sine wave

542

B, C

Sm = 8 µm
Pt = 0.2 µm

Ra = 0.06 µm
     = 2.36 µ in

sine wave

543

B, C

Sm = 2.5 µm
Pt = 0.12 µm

Ra = 0.04 µm
     = 1.58 µ in

sine wave

553

B, C

Consists of 3 patches all on one plate, specimens 526 + 529 + 521 (in that order)

561

n/a

Sm = 25 µm
Pt = 1.6 µm

n/a

 pyramidal frustrum

562

n/a

Sm = 80 µm
Pt = 7.1 µm

n/a

 pyramidal frustrum

564

n/a

Sm = 250 µm
Pt = 20.25 µm

n/a

 pyramidal frustrum

 

A Note About Certification

Any of our specimens can be provided with a traceable in-house calibration certificate which will state: the results of the calibration performed in our measuring laboratory, the measuring conditions, and the estimated uncertainty. The price of such a calibration will depend on the exact requirements, therefore please enquire at time of ordering the specimen.

For some of our specimens we are able to provide free of charge a copy of a measuring report of measurements performed on a master specimen which was used to make replicas. This will give a good idea of certain parameter values of the replica specimen, but it is not a traceable calibration certificate. Please ask for further details at time of ordering.

 

Item 540: razor blade vise for checking stylus tip size

The razor-blade technique, in which a stylus is traced over the sharp edge of a razor-blade in order to get a profile of the stylus-tip itself, is widely regarded as the only simple method to examine stylus tip shape without an electron microscope.

This easy-to-use vise makes the job simpler, by holding the blade safely and securely beneath the stylus. In ISO 5436-1, the razor-edge is referred to as a type B3 measurement standard.

 
 
 

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